# FS-PETRA

 2017-12-0613:22 [PUBDB-2017-12786] Journal Article et al Ptychographic analysis of the photorefractive effect in LiNbO$_{3}$:Fe Optics express 25(25), 31640 - 31650 (2017) [10.1364/OE.25.031640]   We present light induced refractive index changes in iron doped lithium niobate detected with a novel microscopy technique called ptychography. This method determines the change of the refractive index together with the intensity distribution of the writing beam from a single scan with a reconstructed spatial resolution of 3 μm and a sensitivity of the refractive index change of 10$^{−5}$ [...] Restricted: PDF PDF (PDFA); 2017-10-2316:15 [PUBDB-2017-11500] Journal Article et al Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry Scientific reports 7(1), 13698 (2017) [10.1038/s41598-017-13710-8]   The Linac Coherent Light Source (LCLS) is an X-ray source of unmatched brilliance, that is advancing many scientific fields at a rapid pace. The highest peak intensities that are routinely produced at LCLS take place at the Coherent X-ray Imaging (CXI) instrument, which can produce spotsize at the order of 100 nm, and such spotsizes and intensities are crucial for experiments ranging from coherent diffractive imaging, non-linear x-ray optics and high field physics, and single molecule imaging. [...] OpenAccess: PDF PDF (PDFA); 2017-08-3111:03 [PUBDB-2017-10179] Journal Article et al Imaging at an x-ray absorption edge using free electron laser pulses for interface dynamics in high energy density systems Review of scientific instruments 88(5), 053501 (2017) [10.1063/1.4982166]   Tuning the energy of an x-ray probe to an absorption line or edge can provide material-specific measurements that are particularly useful for interfaces. Simulated hard x-ray images above the Fe K-edge are presented to examine ion diffusion across an interface between Fe$_2$O$_3$ and SiO$_2$ aerogel foam materials [...] OpenAccess: PDF PDF (PDFA); 2017-08-2616:35 [PUBDB-2017-09888] Dissertation / PhD Thesis Stierle, A. Resonant Hard X-ray Ptychography for High-Sensitivity Imaging with Chemical Contrast 125 pp. (2017) [10.3204/PUBDB-2017-09888] = University of Hamburg, Diss., 2017   For the detailed investigation of biological, chemical or physical processes on the nano scale, high-resolution imaging techniques are essential. For this purpose, the coherentimaging technique – X-ray ptychography – has been established in recent years. [...] OpenAccess: PDF PDF (PDFA); 2017-07-2519:31 [PUBDB-2017-08515] Dissertation / PhD Thesis Stierle, A. Resonant Hard X-ray Ptychography for High-Sensitivity Imaging with Chemical Contrast 124 pp. (2017) = University of Hamburg, Diss., 2017 2017-06-2313:44 [PUBDB-2017-05999] Journal Article et al Evolutionary-Optimized Photonic Network Structure in White Beetle Wing Scales Advanced materials N.A., 1702057 - (2017) [10.1002/adma.201702057] 2017-06-0213:56 [PUBDB-2017-04214] Journal Article et al Stability of a Bifunctional Cu-Based Core@Zeolite Shell Catalyst for Dimethyl Ether Synthesis Under Redox Conditions Studied by Environmental Transmission Electron Microscopy and In Situ X-Ray Ptychography Microscopy and microanalysis 23(03), 501 - 512 (2017) [10.1017/S1431927617000332]   When using bifunctional core@shell catalysts, the stability of both the shell and core–shell interface is crucial for catalytic applications. In the present study, we elucidate the stability of a CuO/ZnO/Al$_2$O$_3$@ZSM-5 core@shell material, used for one-stage synthesis of dimethyl ether from synthesis gas. [...] Restricted: PDF PDF (PDFA); 2017-03-0723:01 [PUBDB-2017-01322] Journal Article et al Structure and Composition of Isolated Core-Shell (In, Ga) N/GaN Rods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy Physical review applied 7(2), 024033 (2017) [10.1103/PhysRevApplied.7.024033]   Nanofocus x-ray diffraction is used to investigate the structure and local strain field of an isolated (In,Ga)N/GaN core-shell microrod. Because the high spatial resolution of the x-ray beam is only 80×90  nm$^2$, we are able to investigate several distinct volumes on one individual side facet. [...] OpenAccess: PDF; 2017-03-0722:35 [PUBDB-2017-01321] Journal Article et al Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses Applied physics letters 110(10), 101103 (2017) [10.1063/1.4977882]   In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. [...] OpenAccess: PDF; 2017-03-0311:23 [PUBDB-2017-01280] Journal Article et al Perfect X-ray focusing via fitting corrective glasses to aberrated optics Nature Communications 8, 14623 (2017) [10.1038/ncomms14623]   Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology [...] OpenAccess: PDF;