# FS-PETRA

Latest additions:
 2018-01-1210:19 [PUBDB-2018-00592] Journal Article et al Materials for x-ray refractive lenses minimizing wavefront distortions MRS bulletin 42(6), 430 - 436 (2017) [10.1557/mrs.2017.117]   Refraction through curved surfaces, reflection from curved mirrors in grazing incidence, and diffraction from Fresnel zone plates are key hard x-ray focusing mechanisms. In this article, we present materials used for refractive x-ray lenses. [...] Restricted: PDF PDF (PDFA); 2017-12-1810:48 [PUBDB-2017-13610] Journal Article/Contribution to a conference proceedings/Contribution to a book et al Aberration correction for hard x-ray focusing at the nanoscale Advances in X-Ray/EUV Optics and Components XII : [Proceedings] - SPIE, 2017. - ISBN 9781510612297 ISBN 9781510612303 - doi:10.1117/12.2274030Advances in X-Ray/EUV Optics and Components XII, Meeting locationSan Diego, USA, 6 Aug 2017 - 10 Aug 2017 Proceedings of SPIE 10386, 103860A (2017) [10.1117/12.2274030]   We developed a corrective phase plate that enables the correction of residual aberration in reflective, diffractive, and refractive X-ray optics. The principle is demonstrated on a stack of beryllium compound refractive lenses with a numerical aperture of 0.49 10$^{-3}$ at three synchrotron radiation and x-ray free-electron laser facilities, where we corrected spherical aberration of the optical system. [...] OpenAccess: PDF PDF (PDFA); 2017-12-1810:44 [PUBDB-2017-13609] Journal Article et al Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses Journal of synchrotron radiation 25(1), 1 - 8 (2018) [10.1107/S1600577517015272]   Wavefront errors of rotationally parabolic refractive X-ray lenses made of beryllium (Be CRLs) have been recovered for various lens sets and X-ray beam configurations. Due to manufacturing via an embossing process, aberrations of individual lenses within the investigated ensemble are very similar [...] OpenAccess: PDF PDF (PDFA); 2017-12-0613:22 [PUBDB-2017-12786] Journal Article et al Ptychographic analysis of the photorefractive effect in $\mathrm{LiNbO_{3}}$:Fe Optics express 25(25), 31640 - 31650 (2017) [10.1364/OE.25.031640]   We present light induced refractive index changes in iron doped lithium niobate detected with a novel microscopy technique called ptychography. This method determines the change of the refractive index together with the intensity distribution of the writing beam from a single scan with a reconstructed spatial resolution of 3 μm and a sensitivity of the refractive index change of 10$^{−5}$. [...] OpenAccess: PDF PDF (PDFA); 2017-11-2812:47 [PUBDB-2017-12445] Journal Article/Contribution to a conference proceedings/Contribution to a book et al PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector SPIE OPTICAL ENGINEERING + APPLICATIONS | 6-10 AUGUST 2017; X-Ray Nanoimaging: Instruments and Methods IIIX-Ray Nanoimaging: Instruments and Methods III, Meeting locationSan Diego, United States, 6 Aug 2017 - 10 Aug 2017 Proceedings of SPIE 10389, 1038901 (2017) [10.1117/12.2273710]   In recent years, ptychography has revolutionized x-ray microscopy in that it is able to overcome the diffraction limit of x-ray optics, pushing the spatial resolution limit down to a few nanometers. However, due to the weak interaction of x rays with matter, the detection of small features inside a sample requires a high coherent fluence on the sample, a high degree of mechanical stability, and a low background signal from the x-ray microscope. [...] OpenAccess: PDF PDF (PDFA); 2017-10-2316:15 [PUBDB-2017-11500] Journal Article et al Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry Scientific reports 7(1), 13698 (2017) [10.1038/s41598-017-13710-8]   The Linac Coherent Light Source (LCLS) is an X-ray source of unmatched brilliance, that is advancing many scientific fields at a rapid pace. The highest peak intensities that are routinely produced at LCLS take place at the Coherent X-ray Imaging (CXI) instrument, which can produce spotsize at the order of 100 nm, and such spotsizes and intensities are crucial for experiments ranging from coherent diffractive imaging, non-linear x-ray optics and high field physics, and single molecule imaging. [...] OpenAccess: PDF PDF (PDFA); 2017-08-3111:03 [PUBDB-2017-10179] Journal Article et al Imaging at an x-ray absorption edge using free electron laser pulses for interface dynamics in high energy density systems Review of scientific instruments 88(5), 053501 (2017) [10.1063/1.4982166]   Tuning the energy of an x-ray probe to an absorption line or edge can provide material-specific measurements that are particularly useful for interfaces. Simulated hard x-ray images above the Fe K-edge are presented to examine ion diffusion across an interface between Fe$_2$O$_3$ and SiO$_2$ aerogel foam materials. [...] OpenAccess: PDF PDF (PDFA); 2017-08-2616:35 [PUBDB-2017-09888] Dissertation / PhD Thesis Stierle, A. Resonant Hard X-ray Ptychography for High-Sensitivity Imaging with Chemical Contrast 125 pp. (2017) [10.3204/PUBDB-2017-09888] = University of Hamburg, Diss., 2017   For the detailed investigation of biological, chemical or physical processes on the nano scale, high-resolution imaging techniques are essential. For this purpose, the coherentimaging technique – X-ray ptychography – has been established in recent years. [...] OpenAccess: PDF PDF (PDFA); 2017-07-2519:31 [PUBDB-2017-08515] Dissertation / PhD Thesis Stierle, A. Resonant Hard X-ray Ptychography for High-Sensitivity Imaging with Chemical Contrast 124 pp. (2017) = University of Hamburg, Diss., 2017 2017-06-2313:44 [PUBDB-2017-05999] Journal Article et al Evolutionary-Optimized Photonic Network Structure in White Beetle Wing Scales Advanced materials N.A., 1702057 - (2017) [10.1002/adma.201702057]